Please use this identifier to cite or link to this item: https://www.um.edu.mt/library/oar/handle/123456789/25574
Title: Fractal analysis correlation of the images from scanning laser microscopy techniques and atomic force microscopy
Authors: Toma, Antonella
Tranca, Denis E.
Sammut, Charles V.
Stanciu, George A.
Keywords: Atomic force microscopy
Scanning probe microscopy
Scanning systems
Issue Date: 2017
Publisher: Institute of Electrical and Electronics Engineers Inc.
Citation: Toma, A., Tranca, D. E., Sammut, C. V., & Stanciu, G. A. (2017). Fractal analysis correlation of the images from scanning laser microscopy techniques and atomic force microscopy. 19th International Conference on Transparent Optical Networks, ICTON 2017, Girona. 8024986.
Abstract: The laser scanning laser microscopy techniques and atomic force microscopy give complementary information at micro- and nano-scales regarding the surface samples. By using a multimodal microscopy system, having more optical techniques based on far field and near field and an atomic force microscope the same area of the investigated samples. The system is able to acquire the optical images having hundred nanometers or nanometers resolutions and surface topography at nanoscale. Fractal analysis is a very useful tool for quantifying and simulating the complex patterns encountered in microscopic images. The objective of this work is to perform a study of the complex optical and morphological features of certain biological tissues by using fractal geometry. It is shown a correlation between optical images and surface morphology regarding fractal geometry and that fractal dimension is a good candidate to quantify the different images.
URI: https://www.um.edu.mt/library/oar//handle/123456789/25574
Appears in Collections:Scholarly Works - FacSciPhy

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