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dc.contributor.authorAlonso-Fernandez, Fernando-
dc.contributor.authorFarrugia, Reuben A.-
dc.contributor.authorBigun, Josef-
dc.date.accessioned2021-12-20T10:57:03Z-
dc.date.available2021-12-20T10:57:03Z-
dc.date.issued2017-
dc.identifier.citationAlonso-Fernandez, F., Farrugia, R. A., & Bigun, J. (2017, October). Learning-based local-patch resolution reconstruction of iris smart-phone images. 2017 IEEE International Joint Conference on Biometrics (IJCB). 787-793.en_GB
dc.identifier.urihttps://www.um.edu.mt/library/oar/handle/123456789/85820-
dc.description.abstractApplication of ocular biometrics in mobile and at a distance environments still has several open challenges, with the lack quality and resolution being an evident issue that can severely affects performance. In this paper, we evaluate two trained image reconstruction algorithms in the context of smart-phone biometrics. They are based on the use of coupled dictionaries to learn the mapping relations between low and high resolution images. In addition, reconstruction is made in local overlapped image patches, where up-scaling functions are modelled separately for each patch, allowing to better preserve local details. The experimental setup is complemented with a database of 560 images captured with two different smart-phones, and two iris comparators employed for verification experiments. We show that the trained approaches are substantially superior to bilinear or bicubic interpolations at very low resolutions (images of 13×13 pixels). Under such challenging conditions, an EER of ~7% can be achieved using individual comparators, which is further pushed down to 4-6% after the fusion of the two systems.en_GB
dc.language.isoenen_GB
dc.publisherIEEEen_GB
dc.rightsinfo:eu-repo/semantics/restrictedAccessen_GB
dc.subjectBiometric identification -- Technological innovationen_GB
dc.subjectImage reconstructionen_GB
dc.subjectOptical data processingen_GB
dc.subjectPattern recognitionen_GB
dc.titleLearning-based local-patch resolution reconstruction of iris smart-phone imagesen_GB
dc.typeconferenceObjecten_GB
dc.rights.holderThe copyright of this work belongs to the author(s)/publisher. The rights of this work are as defined by the appropriate Copyright Legislation or as modified by any successive legislation. Users may access this work and can make use of the information contained in accordance with the Copyright Legislation provided that the author must be properly acknowledged. Further distribution or reproduction in any format is prohibited without the prior permission of the copyright holder.en_GB
dc.bibliographicCitation.conferencename2017 IEEE International Joint Conference on Biometrics (IJCB)en_GB
dc.bibliographicCitation.conferenceplaceDenver, CO, USA, 1-4/10/2017en_GB
dc.description.reviewedpeer-revieweden_GB
dc.identifier.doi10.1109/BTAS.2017.8272771-
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