Please use this identifier to cite or link to this item: https://www.um.edu.mt/library/oar/handle/123456789/92454
Full metadata record
DC FieldValueLanguage
dc.contributor.authorShukla, Pratik-
dc.contributor.authorShen, Xiaojun-
dc.contributor.authorAllott, Ric-
dc.contributor.authorErtel, Klaus-
dc.contributor.authorRobertson, S.-
dc.contributor.authorCrookes, R.-
dc.contributor.authorWu, H.-
dc.contributor.authorZammit, Ann-
dc.contributor.authorSwanson, Philip-
dc.contributor.authorFitzpatrick, Michael E.-
dc.date.accessioned2022-03-28T06:26:21Z-
dc.date.available2022-03-28T06:26:21Z-
dc.date.issued2021-
dc.identifier.citationShukla, P., Shen, X., Allott, R., Ertel, K., Robertson, S., Crookes, R.,... Fitzpatrick, M. E. (2021). Response of silicon nitride ceramics subject to laser shock treatment. Ceramics International, 47(24), 34538-34553.en_GB
dc.identifier.urihttps://www.um.edu.mt/library/oar/handle/123456789/92454-
dc.description.abstractA comprehensive and novel investigation on multiple-layer, square-beam laser shock treatment (“laser peening”) of Si3N4 ceramics is reported in this work. Surface topography, hardness, fracture toughness (KIc), residual stresses, and microstructural changes were investigated. The evaluation of fracture toughness via the Vickers hardness indentation method revealed a reduction in crack lengths produced by the indenter after laser shock treatment (LST). Upon appropriate calculation, this revealed an increase in KIC of 60%. This being attributed to a near-surface (50 μm depth) compressive residual stress measured at -289 MPa. Multiple layer LST also induced beneficial residual stresses to a maximum measured depth of 512 μm. Oxidation was evident, only on the top surface of the ceramic, post LST (<5 μm depth) and was postulated to be due to hydrolyzation. The surface enhancement in KIC and flaw-size reduction was assigned to an elemental change on the surface, whereby, Si3N4 was transformed to SiO2, particularly, with multiple layers of LST. Compressive residual stresses measured in the sub-surface were attributed to mechanical effects (below sub-surface elastic constraint) and corresponding shock- wave response of the Si3N4. This work has led to a new mechanistic understanding regarding the response of Si3N4 ceramics subject to the LST deployed in this research. The findings are significant because inducing deep compressive residual stresses and corresponding enhancement in surface KIC are important for the enhanced durability in many applications of this ceramic, including cutting tools, hip and knee implants, dental replacements, bullet-proof vests and rocket nozzles in automotive, aerospace, space and biomedical industries.en_GB
dc.language.isoenen_GB
dc.publisherElsevieren_GB
dc.rightsinfo:eu-repo/semantics/restrictedAccessen_GB
dc.subjectLaser peeningen_GB
dc.subjectCeramics -- Surfaces -- Testingen_GB
dc.subjectCeramics -- Microstructureen_GB
dc.subjectCeramics -- Fractureen_GB
dc.subjectPeening (Metal-work)en_GB
dc.subjectSilicon nitride -- Testingen_GB
dc.titleResponse of silicon nitride ceramics subject to laser shock treatmenten_GB
dc.typearticleen_GB
dc.rights.holderThe copyright of this work belongs to the author(s)/publisher. The rights of this work are as defined by the appropriate Copyright Legislation or as modified by any successive legislation. Users may access this work and can make use of the information contained in accordance with the Copyright Legislation provided that the author must be properly acknowledged. Further distribution or reproduction in any format is prohibited without the prior permission of the copyright holder.en_GB
dc.description.reviewedpeer-revieweden_GB
dc.identifier.doi10.1016/j.ceramint.2021.08.369-
dc.publication.titleCeramics Internationalen_GB
Appears in Collections:Scholarly Works - FacEngMME

Files in This Item:
File Description SizeFormat 
Response_of_silicon_nitride_ceramics_subject_to_laser_shock_treatment_2021.pdf
  Restricted Access
18.26 MBAdobe PDFView/Open Request a copy


Items in OAR@UM are protected by copyright, with all rights reserved, unless otherwise indicated.