Investigation of test circuit parameters for characterizing IGBT dynamic performance

Abstract

This dissertation shows the study of IGBT devices and their protection devices. A laboratory based setup, consisting of a Double Pulse Test setup and saturation-voltage measurement circuits were constructed to be able to test the IGBTs. Various type of IGBTs were tested, and some of the tests which were carried out, consisted of the measurement of switching energy losses, the conduction power losses, snubber circuit analysis and the measurement of the junction temperature. Finally a conclusion about the ideal test setup consisting of all the analysis from the various tests done made will be shown.