Browsing by Subject Semiconductors
Showing results 1 to 14 of 14
| Issue Date | Title | Author(s) |
| 1993 | Accurate small-signal modelling of a double barrier resonant tunnelling diode (DBRTD) | Sammut, Charles V.; Cronin, Nigel J.; Schnell, R. D.; Tews, H. |
| 2021 | Analysis towards energy savings in dry storage systems of semiconductor devices | Frendo, Daniel (2021) |
| 1990 | Bit-slice microprocessor system design | Gatt, Alessio (1990) |
| 1968 | Determination of electron density of Gallium antimonide | Sultana, Joseph A. (1968) |
| 1992 | Drives for power electronics devices | Borg, Rene (1992) |
| 2003 | Epitaxial wafer substantially free of grown-in defects : U. S. Patent No. 6,565,649 B2 | Mule’ Stagno, Luciano; Fei, Lu; Holzer, Joseph C.; Korb, Harold W.; Falster, Robert J. |
| 2015 | Investigation of warpage in wafer-level molding : measurements and FE analysis | Farrugia, Russell; Grech, Ivan; Casha, Owen; Micallef, Joseph; Gatt, Edward; Ellul, Ivan; Duca, Roseanne; Borg, Ingram |
| 2003 | Method for revealing agglomerated intrinsic point defects in semiconductor crystals : U. S. Patent No. 6,638,357 B2 | Mule’ Stagno, Luciano; Falster, Robert J. |
| 1986 | Optical fibre communications | Bugeja, Joseph (1986) |
| 2002 | Process for detecting agglomerated intrinsic point defects by metal decoration : U.S. Patent No. 6,391,662 B1 | Mule’ Stagno, Luciano; Falster, Robert J. |
| 2003 | Process for suppressing the nucleation and/or growth of interstitial type defects by controlling the cooling rate through nucleation : U. S. Patent Application Publication No. 2003/0196587 A1 | McCallum, Kirk D.; Alexander, W. Brock; Banan, Mohsen; Falster, Robert J.; Holzer, Joseph C.; Johnson, Bayard K.; Bum Kim, Chang; Kimbel, Steven L.; Lu, Zheng; Mutti, Paolo; Voronkov, Vladimir V.; Mule’ Stagno, Luciano; Libbert, Jeffrey L. |
| 1989 | Reliability studies involving semiconductor device | Tonna, Simon (1989) |
| 1980 | A study on microprocessors with special reference to the MC6800 | Maione, Vincent (1980) |
| 2016-12 | Testing MEMS | Duca, Edward |
