Please use this identifier to cite or link to this item: https://www.um.edu.mt/library/oar/handle/123456789/108629
Title: The effects of strain on the confinement profile of disordered InGaAs/GaAs single quantum wells
Authors: Micallef, Joseph
Li, E. Herbert
Weiss, Bernard L.
Keywords: Chemicals -- Analysis
Inorganic compounds -- Analysis
Residual stresses
Gallium compounds
Gallium arsenide
Indium
Quantum wells
Electronic structure
Issue Date: 1993
Publisher: Academic Press Limited
Citation: Micallef, J., Li, E. H., & Weiss, B. L. (1993). The effects of strain on the confinement profile of disordered InGaAs/GaAs single quantum wells. Superlattices and microstructures, 13(1), 125-132.
Abstract: The effects of strain on the carrier confinement profile of disordered InGaAs/GaAs single quantum wells, assuming an error function compositional profile after interdiffusion, are studied here. Details are given showing how strain and disorder modify the confinement profile, the ground state transition energy and the strain-induced heavy hole-light hole band edge splitting. The shape of the confinement profile of disordered InGaAs/GaAs quantum well structures is shown to be more sensitive to the indium content than to the width of the as-grown quantum well.
URI: https://www.um.edu.mt/library/oar/handle/123456789/108629
Appears in Collections:Scholarly Works - FacICTMN

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